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CGM at 19th AIPnD Congress – National Conference on Non-Destructive Tests, Monitoring and Diagnostics

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    This year, from 19 to 21 October, CGM had the pleasure of actively participating at the 19th AIPnD Congress – National Conference on Non-Destructive Tests, Monitoring and Diagnostics, organized by the AIPnD Italian Society for NDT in Verona, Italy.

    The event was undoubtedly a success: not only from the “interpersonal” point of view, with hundreds of professionals meeting in person again and exchanging opinions after a long time, but also from an organizational perspective, with a series of presentations delivered by the industry experts, aimed at putting in light some of the major issues and topics related to the NDT field.

    The Opening ceremony included a panel of guest speakers talking about highly relevant topics: starting with the report on climate change (today more alarming than ever), which necessarily also involves NDT, moving on to other topics that are more visionary and optimistic, such as the possibility for humans in the coming years to reach not only the Moon but Mars as well, thanks to cutting-edge space missions, or the concrete opportunity to make a real energy shift in terms of fuel, thanks to the increasingly advanced studies on development of hydrogen engines.

    CGM was proud to receive a participation award during this Opening ceremony.

    The days at the exhibition were busy with the meetings and resulted to be fruitful on both commercial and interpersonal levels, with numerous visits to our stand by friends and long-time customers.

    We look forward to repeating the experience during the 20th Congress, which will take place in two years: cannot wait to see all those who wish to come and visit us!

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      CGM CIGIEMME S.p.A. designs and manufactures a complete range of Magnetic Testing (MT) and Penetrant Testing (PT) systems, from simple equipment to highly customized systems, also offering a complete range of consumables, tools, accessories and instruments used in the MT and PT fields.
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